Small-spot X-ray Photoelectron Spectroscopy
XPS

(PHI Model 5600ci, with RBD Windows Upgrade,  and Casa XPS analytical software)
Purchased by a grant from Murdock Charitable Trust and MSU

X-ray Photoelectron Spectroscopy (XPS, also known as ESCA) uses highly focused monochromatised x-rays to probe the material of interest. The energy of the photo-emitted electrons ejected by the x rays are specific to the chemical state of the elements and compounds present, i.e. bound-state or multivalent states of individual elements can be differentiated.

The "small-spot" capabilities allow one to obtain XPS information at 30-micron resolutions, making XPS chemical mapping and imaging a viable surface research tool. The XPS can easily analyze nonconductive samples with the system's charge neutralization. Fast entry lock allows 15 minutes of turn-around time. The system has a cold stage, which allows sample analysis at liquid nitrogen temperatures.

As an integral part of the system, the computer with up to date software delivers complete surface analysis for XPS, including sophisticated routines for elemental and chemical state quantification, as well as peak fitting and depth profiling. The system has data and sample stage automation facilities which allows the user to predefine the analysis and leave the system to acquire the data. Chemical state imaging of the sample is also available with resolutions near 30 microns.
Small-spot XPS can provide the following information about samples:

	Elemental identification and quantification
	Chemical functional group identification and quantification
	Chemical state imaging
	Surface sensitivity
	Layer-by-layer depth profiling
	Minimal sample damage
	Analysis of insulating and conducting samples
	Data collection/stage automation
	Cold stage

[Instrumentation] [AFM] [Auger] [FESEM] [SEM] [SIMS] [XRD] [XPS]
[ICAL Staff] [Contacting ICAL]
[Dept. of Physics] [Montana State University]
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