afm

Atomic Force Microscope (AFM)

VEECO MultiMode V and Dimension 3100
  • Imaging of conducting and non-conducting surfaces
  • Sub-nanometer resolution
  • Imaging in air and liquid, allowing in-situ measurements and real time imaging of biological and chemical processes
  • AFM can be used to measure and localize many different forces including: adhesion strength, magnetic forces and mechanical properties
  • True 3D imaging and measurements
  • Magnetic, friction, chemical, and phase imaging
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fesem

Field Emission Scanning Electron Microscope(FE SEM)

Zeiss SUPRA 55VP
  • Ultra high resolution at low kV: 1.7nm @ 1.0kV, 4 nm @ 0.1kV
  • Quantitative elemental analysis of the "bulk" material
  • Fast elemental mapping and / or linescan of area of interest
  • Topographical, compositional and other information
  • Detection of small variations of trace element content
  • Analysis and imaging of samples in their natural, hydrated state without the use of cryo
  • Digital output
  • Oil-free vacuum
  • Large specimen capacity
  • Rapid (10 minute turnaround) sample introduction
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sem

Scanning Electron Microscope (SEM)

JEOL JSM-6100
  • Secondary Electron Imaging (SEI)
  • Backscattered Electron Imaging (BEI)
  • Cathodo-Luminescence detection and imaging (CL)
  • Energy Dispersive x-ray Spectroscopy (X-Flash fast X-ray mapping detector)
  • Cryo-preparation chamber with cold / hot stage
  • High-resolution imaging
  • Digital image capture
  • Quantitative elemental analysis of the "bulk" material
  • Fast elemental mapping and / or linescan of area of interest
  • Topographical and density imaging
  • Detection of small variations of trace element content
  • Analysis and Imaging of samples in their natural, hydrated state
  • MORE INFORMATION »
xps

X-ray Photoelectron Spectrometer (XPS)

Physical Electronics 5600
  • Elemental identification and quantification
  • Chemical functional group identification and quantification
  • Chemical state imaging
  • Surface sensitivity
  • Layer-by-layer depth profiling
  • Minimal sample damage
  • Analysis of insulating and conducting samples
  • Data collection / stage automation
  • Cold stage
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XRD

X-ray Powder Diffraction Spectrometer (XRD)

Scintag X1 Diffraction System
  • Rapid identification of materials
  • Ease of sample preparation
  • Computer-aided material identification
  • Large library of known crystalline structures
  • Multi-sample stage
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sims

Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)

PHI TRIFT 1
  • Chemical compound identification
  • Elemental and chemical mapping
  • Surface sensitivity
  • Trace element sensitivity (ppm or ppb)
  • Retrospective analysis
  • Analysis of insulating and conducting samples
  • Depth profiling
  • Cold stage
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auger

Scanning Auger Electron Microprobe (AUGER)

Physical Electronics 6600
  • Rapid sample introduction
  • Low-Z elemental detection
  • Quantitative analysis, mapping, linescan
  • Surface sensitivity
  • Enhanced lateral spatial resolution for elemental analysis (<500A)
  • Limited chemical information
  • Sputter depth profiling (three dimensional analysis)
  • High resolution secondary electron imaging of analysis area
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olympus

Epifluorescence Optical Microscope

OLYMPUS BX-61
  • Precision objectives including air, oil and water immersion objectives
  • Suite of reflected (fluorescent) filters (DAPI, FITC/CY2, TRITC/CY3, triple band and RBF)
  • Significantly reduced autofluorescence and signal-to-noise ratio
  • DIC imaging (10x, 20x, 40x, 60x)
  • Digital camera imaging for still and time-lapse observations
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Critical Point Dryer

Critical Point Dryer (CPD)

Tousimis SAMDRI®-795
  • Alternative to air drying for vacuum samples
  • Reduces imaging artifacts 
  • Uses liquid CO2
  • MORE INFORMATION »