ICAL instrumentation

Instrumentation

Atomic Force Microscope (AFM)

Atomic Force Microscope (AFM)

  • Imaging of conducting and non-conducting surfaces

  • Sub-nanometer resolution

  • Imaging in air and liquid, allowing in-situ measurements and real time imaging of biological and chemical processes

  • AFM can be used to measure and localize many different forces including: adhesion strength, magnetic forces and mechanical properties

  • True 3D imaging and measurements

  • Magnetic, friction, chemical, and phase imaging

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    Field Emission Scanning Electron Microscope (FE SEM)

    Field Emission Scanning Electron Microscope
    (FE SEM)

  • Ultra high resolution at low kV: 1.7nm @ 1.0kV, 4 nm @ 0.1kV

  • Quantitative elemental analysis of the "bulk" material

  • Fast elemental mapping and / or linescan of area of interest

  • Topographical, compositional and other information

  • Detection of small variations of trace element content

  • Analysis and imaging of samples in their natural, hydrated state without the use of cryo

  • Digital output

  • Oil-free vacuum

  • Large specimen capacity

  • Rapid (10 minute turnaround) sample introduction

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    Scanning Electron Microscope (SEM)

    Scanning Electron Microscope (SEM)

  • Secondary Electron Imaging (SEI)

  • Backscattered Electron Imaging (BEI)

  • Cathodo-Luminescence detection and imaging (CL)

  • Energy Dispersive x-ray Spectroscopy (X-Flash fast X-ray mapping detector)

  • Cryo-preparation chamber with cold / hot stage

  • High-resolution imaging

  • Digital image capture

  • Quantitative elemental analysis of the "bulk" material

  • Fast elemental mapping and / or linescan of area of interest

  • Topographical and density imaging

  • Detection of small variations of trace element content

  • Analysis and Imaging of samples in their natural, hydrated state

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    Small-Spot X-ray Photoelectron Spectrometer (XPS)

    Small-Spot X-ray Photoelectron Spectrometer (XPS)

  • Elemental identification and quantification

  • Chemical functional group identification and quantification

  • Chemical state imaging

  • Surface sensitivity

  • Layer-by-layer depth profiling

  • Minimal sample damage

  • Analysis of insulating and conducting samples

  • Data collection / stage automation

  • Cold stage

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    Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)

    Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS)

  • Chemical compound identification

  • Elemental and chemical mapping

  • Surface sensitivity

  • Trace element sensitivity (ppm or ppb)

  • Retrospective analysis

  • Analysis of insulating and conducting samples

  • Depth profiling

  • Cold stage

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    X-Ray Powder Diffraction Spectrometer (XRD)

    X-Ray Powder Diffraction Spectrometer (XRD)

  • Rapid identification of materials

  • Ease of sample preparation

  • Computer-aided material identification

  • Large library of known crystalline structures

  • Multi-sample stage

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    Scanning Auger Electron Microprobe (AUGER)

    Scanning Auger Electron Microprobe (AUGER)

  • Rapid sample introduction

  • Low-Z elemental detection

  • Quantitative analysis, mapping, linescan

  • Surface sensitivity

  • Enhanced lateral spatial resolution for elemental analysis (<500A)

  • Limited chemical information

  • Sputter depth profiling (three dimensional analysis)

  • High resolution secondary electron imaging of anlysis area

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    Epifluorescence Optical Microscope

    Epifluorescence Optical Microscope

  • Precision objectives including air, oil and water immersion objectives

  • Suite of reflected (fluorescent) filters (DAPI, FITC/CY2, TRITC/CY3, triple band and RBF)

  • Significantly reduced autofluorescence and signal-to-noise ratio

  • DIC imaging (10x, 20x, 40x, 60x)

  • Digital camera imaging for still and time-lapse observations

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