Journal articles
PowerPoint
Prof. Chi-Shun Tu
Prof. John Neumeier
HC Materials - Pendi Han
SICCAS - HS Luo
Microfine - L.-C. Lim
XRD, SEM
MSU Physics Department
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- (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-xPT)
- (1-x)Pb(Zn1/3Nb2/3)O3-xPbTiO3 (PZN-xPT)
- (1-x)Pb(In1/2Nb1/2)O3-xPbTiO3 (PIN-xPT)
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Crystal Characterization
High-strain relaxor-based ferroelectric (FE) single crystals
Pb(Mg1/3Nb2/3)1-xTixO3
(PMNTx) and Pb(Zn1/3Nb2/3)1-xTixO3
(PZNTx) exhibit extremely large electromechanical coupling factor k33
(>94%), ultrahigh piezoelectric coefficient d33 (>2500 pC/N), a large strain level
(up to ~1.7%), and low hysteresis. Such high piezoelectric performance, which converts mechanical and electric
energies, gives extremely promising applications in medical imaging, actuators, sonar, and accelerometers. The
exceptional piezoelectric properties have been related to the existence of MA-,
MB-, and MC-type monoclinic (M) and orthorhombic (O) phases
in the morphotropic phase boundary (MPB) region between rhombohedral (R) and tetragonal (T) phases.
The intermediate phases (M and O) have been found in both PMNTx and PZNTx, and
strongly depend on titanium content, temperature, history, strength of external E field, and
crystallographic orientation. However, thermal instability (variation with temperature) caused by overheating
still remains a challenging issue in use of these materials. Physical properties of PMNT and PZNT are sensitive
to Ti content, poling process, electric (E)-field strength, crystallographic orientation, and history.
To find high-strain piezoelectric crystals with high TC (Curie or depolarization temperatures) is also
a goal in our research, so that thermal instability can be minimized. Among high-TC piezoelectric crystals,
Pb(In1/2Nb1/2)x(Mg1/3Nb2/3)yTizO3
(PIMNTx/y/z) crystals and ceramics have drawn attention in recent years.
We characterize their E-field-, temperature-, and orientation-dependent domain structures and phases using:
- Dielectric permittivity measurements
- Polarizing microscopy
- Ferroelectric hysteresis-loop analysis
- Strain measurement
- Brillouin light scattering
- X-ray diffraction (XRD)
- Scanning electron microscopy (SEM)
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