ROLE OF SURFACE STRAIN IN TRANSITION METAL FILM GROWTH
ON ALUMINUM SINGLE CRYSTAL SURFACES
R. J. Smith, N. R. Shivaparan, V. Krasemann, V. Shutthanandan, Adli A. Saleh
Physics Department, Montana State University, Bozeman, MT 59717*
The growth of thin Pd, Ni, Fe and Ti films on Al(110) surfaces has been studied using high-energy ion scattering and x-ray photoemission techniques. Of these four metals only Ti grows as an epitaxial overlayer. The other three metals mix with the substrate to form surface alloys at the interface. A simple bond-energy model is used to explain this behavior based on the strain associated with forming a transition metal aluminide at the surface.
*Work supported by NSF
Journal of the Korean Physical Society,to be published in (1997)
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